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18 ·ÎÅ͸®¿¬»è±â(DRG570) ȭõ(KOREA) 1 2001
17 ·ÎÅ͸®¿¬»è±â BLANCHARD(USA) 2 1972
16 ·ÎÅ͸®¿¬»è±â ICHIKAWA(JAPAN) 1 1995
15 6 SPINDLE POLISHING M/C SIDAE(KOREA) 12Ãà 2008/2010
14 4 SPINDLE POLISHING M/C SIDAE(KOREA) 32Ãà 2001/2010
13 HIGH SPEED POLISHING M/C SIDAE(KOREA) 32Ãà 2008/2010
12 DOUBLE SIDE POLISHING M/C WAIDA(JAPAN) 2 2010
11 CENTERING M/C SIDAE(KOREA) 4 2001/2010
10 CURVE GENERATION M/C SIDAE(KOREA) 6 2008/2010
9 CUTTING M/C SIDAE(KOREA) 2 2001
8 CYLINDRICAL GRINDING M/C OKUMA(JAPAN) 2 2002
7 CYLINDRICAL POLISHING M/C SIDAE(KOREA) 4 2002/2010
6 FLAT POLISHING M/C SPITFIRE(USA) 1 2001
5 COATOR(¥Õ600:1,¥Õ950:3,¥Õ1200:2,¥Õ1500:1) INTEC(KOREA) 7 2001
4 ULTRA CLEANER DAEHAN(KOREA) 1 2001
3 CLEAN BENCH ½Å¸íÅ©¸°(KOREA) 6 2001/2010
2 OVEN( ~ 300¡ÆC) ´ëÇÑ(KOREA) 2 2001
1 OVEN( ~ 1,200¡ÆC) ¿ì½Å»ó»ç(KOREA) 1 2007
 
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13 SPECTROMETER(UV~NIR) PERKIN ELMER(USA) 2 2010
12 SPECTROMETER(VISIBLE) HITACHI(JAPAN) 1 2007
11 SPECTROMETER(LONG IR) PERKIN ELMER(USA) 1 2008
10 INTERFEROMETER ZYGO(USA) 2 2001
9 AUTO COLLIMATER NIKON(JAPAN) 2 2001
8 CENTERING SCOPE PEARL(JAPAN) 2 2008
7 STEREO SCOPE NIKON(JAPAN) 2 2009
6 MICROSCOPE SAMWON(KOREA) 2 2003/2009
5 VACCUM MICROSCOPE MIRERO(KOREA) 1 2010
4 METALLURGICAL MICROSCOPE SAMWON(KOREA) 1 2010
3 RADIUS LENGTHMETER UNIVERSAL(USA) 1 1995
2 INTERFEROMETER DIVISION(USA) 1 1990
1 PROFILE PROJECTOR RATIONAL(TAIWAN) 1 2006
 
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COATING SHOP
INTERFEROMETER(ZYGO)
SPECTROPHOTOMETER
POLISHING
CENTERING MACHINE
MACHINE SHOP
AUTO COLLIMATOR
CURVE GENERATION
MACHINE
COATING JIG
  1 /